Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Conventional C-AFM has faced historic challenges in terms of visualization limitations and artifacts from tip-sample ...

These investigations can be combined with other methods, like Dark Lift, for artifact-free outcomes in scanning spreading resistance microscopy (SSRM), scanning capacitance microscopy (SCM), tunneling ...