It is also used in measurements of surface and adhesion forces. The Veeco Dimension 3000 atomic force microscope (AFM) is used to analyze a variety of sample sizes and types. It can function in air or ...

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...

Conventional C-AFM has faced historic challenges in terms of visualization limitations and artifacts from tip-sample ...

Atomic Force Microscopy (AFM) is a versatile tool for nanomechanical characterization ... as the small scales involved can introduce uncertainties and artifacts. The development of standardized ...

These investigations can be combined with other methods, like Dark Lift, for artifact-free outcomes in scanning spreading resistance microscopy (SSRM), scanning capacitance microscopy (SCM), tunneling ...